Journal of electronic testing: Theory and applications

• 

  Año 2005, Número 6

  • Editorial

    V. D. Agrawal

    pág. 567

    

  • Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit

    J. Y. Ryu, B. C. Kim

    págs. 571-581

    

  • Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors

    Yolanda Lechuga Solaegui, Miguel Ángel Allende Recio, R. Mozuelos, M. Martínez

    págs. 583-598

    

  • Multiple-Constraint Driven System-on-Chip Test Time Optimization

    E. Larsson, J. Pouget

    págs. 599-611

    

  • Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees

    H. Yotsuyanagi

    págs. 613-620

    

  • A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices

    B. Wang, T. Farahmand, A. Kuo

    págs. 621-630

    

  • The Coupling Model for Function and Delay Faults

    J. Yi, J. P. Hayes

    págs. 631-649

    

  • Abort-on-Fail Based Test Scheduling

    J. Pouget, E. Larsson

    págs. 651-658