Fatigue & fracture of engineering materials & structures

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  Año 2005, Número 8

  • Characterization of Micro/Nano Electro-Mechanical Systems (MEMS/NEMS)

    Yakichi Higo

    pág. 655

    

  • Advanced resonant ultrasound spectroscopy for measuring anisotropic elastic constants of thin films

    M. Hirao, H. Ogi, N. Nakamura

    págs. 657-663

    

  • Tensile testing of silicon thin films

    T. Tsuchiya

    págs. 665-674

    

  • Mechanical characterization of single crystal silicon and UV-LIGA nickel thin films using tensile tester operated in AFM

    Y. Isono, J. Tada, Y. Lee

    págs. 675-686

    

  • Fracture toughness measurement of thin-film silicon

    M. Shikida, K. Sato, T. Kasai, S. Nakao, X. Li, T. Ando, H. Tanaka

    págs. 687-694

    

  • Fracture tests of microsized TiAl specimens

    T. P. Halford, P. Bowen, K. Takashima, Y. Higo

    págs. 695-701

    

  • Fatigue and fracture of a Ni¿P amorphous alloy thin film on the micrometer scale

    K. Takashima, Y. Higo

    págs. 703-710

    

  • Characterization of structural films using microelectromechanical resonators

    C. L. Muhlstein

    págs. 711-721

    

  • A study of the mechanical and fatigue properties of metallic microwires

    B. Weiss, G. Khatibi, V. Gröger, A. Betzwar-Kotas

    págs. 723-733

    

  • Micromechanical testing of SU-8 cantilevers

    J. Brugger, K. Takashima, T. Kramer, D. Moore, M. Hopcroft, Y. Higo, G. Kim

    págs. 735-742

    

  • Amorphous Mo¿N and Mo¿Si¿N films in microelectromechanical systems

    H. Kattelus, M. Ylönen, M. Blomberg

    págs. 743-749

    

  • Information on conferences/seminars

    págs. 751-752