InstitucionesPeriodo de publicación recogido
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Model refinements of transformers via a subproblem finite element method
Patrick Dular, Patrick Kuo Peng, Mauricio Valencia Ferreira da Luz, Laurent Krähenbühl
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 36, Nº 1, 2017, págs. 309-319
Correction of homogenized lamination stacks via a subproblem finite element method
Patrick Dular, M. V. Ferreira, Patrick Kuo Peng, Laurent Krähenbühl
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 34, Nº 5 (Special Issue: IGTE 2014), 2015, págs. 1553-1563
Ruth V. Sabariego, Peter Sergeant, Johan Gyselinck, Luc Dupré, Christophe Geuzaine, Patrick Dular
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 29, Nº 6 (Special Issue: Selected Papers from EMF), 2010, págs. 1585-1595
A non‐destructive testing application solved with A‐χ geometric eddy‐current formulation
Lorenzo Codecasa, Patrick Dular, Ruben Specogna, Francesco Trevisan
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 29, Nº 6 (Special Issue: Selected Papers from EMF), 2010, págs. 1606-1615
Magnetic model refinement via a perturbation finite element method – from 1D to 3D
Patrick Dular, Ruth V. Sabariego, Laurent Krähenbühl
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 28, Nº 4 (Special Issue: Selected papers from 13th IGTE Symposium), 2009, págs. 974-988
Subdomain perturbation finite element method for skin and proximity effects in inductors
Patrick Dular, Ruth V. Sabariego, Laurent Krähenbühl
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 27, Nº 1, 2008, págs. 72-84
h‐ and b‐conform finite element perturbation techniques for nondestructive eddy current testing
Ruth V. Sabariego, Patrick Dular
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 27, Nº 1, 2008, págs. 319-327
Patrick Dular, Ruth V. Sabariego
Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 26, Nº 3 (Selected papers from the 12th International IGTE Symposium on Numerical Field Calculation in Electri), 2007, págs. 700-711
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