M. Morales Morgado, Juan Miguel León Rojas, Antonio Manuel Silva Luengo, José Moreno del Pozo
Two properties of assymetry, the prototype and the certainty assymetries, are identified as crucial in pattern recognition studies. We propose a family of divergencies between probability distributions, emphasizing those properties.
We then aggregate (cross) these �evertical�f divergencies with some based on �¿ . cuts (�ehorizontal�f) divergencies (Leon-Rojas et al., 1999).
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