Accurate computation of electric field in reverse-biased semiconductor devices:: a mixed finite-element approach
L.D. Marini, A Savini
págs. 123-135
Analysis of a discretization algorithm for stationary continuity equations in semiconductor device models, II
M.S. Mock
págs. 137-149
Harmonic analysis of currents in R, L Systems with semiconductor switching devices
Tadeusz Sobczyk, Bogdan Sapinski
págs. 151-165
Application of a 3-D Eddy current code (Trifou) to non-destructive testing
J.C. Verite
págs. 167-178
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