A stochastic analysis of edge effects on planar resistors

• G. De Mey ^[1]
  1. [1] Laboratory of Electronics, Ghent State University, Bélgica
• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 6, Nº 4, 1987, págs. 191-196
• Idioma: inglés
• Enlaces
  • Texto completo
• Resumen

  • An analytical theory based on a perturbation approach is presented to model planar resistors with a stochastic edge. The theoretical analysis is confirmed by Monte Carlo simulations.