Speckle interferometry based on spatial fringe analysis method using only two speckle patterns

• Autores: Yasuhiko Arai, Takuya Inoue, Shunsuke Yokozeki
• Localización: SPECKLE 2012: V International Conference on Speckle Metrology : 10-12 september 2012 : Vigo, Spain / Ángel Manuel Fernández Doval (ed. lit.), María Cristina Trillo Yáñez (ed. lit.), José Carlos López Vázquez (ed. lit.), 2012, ISBN 9780819490902
• Idioma: inglés
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• Resumen

  • Electronic speckle pattern interferometry is a useful deformation measurement method. In this paper, new speckle interferometry that can measure the deformation with a concave shape distribution based on spatial fringe analysis method by using only two speckle patterns is proposed. The optical system that can record some spatial information into each speckle of speckle pattern is set up by using basic characteristics of speckle phenomenon that has never been used before. In experimental results, it is confirmed that the out-of-plane deformation measurement by using only two speckle patterns before and after the deformation can be precisely performed by this method